Permittivity Measurement of Thin Film Using a Waveguide-type Resonator with a Slot
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: The Journal of Korean Institute of Electromagnetic Engineering and Science
سال: 2013
ISSN: 1226-3133
DOI: 10.5515/kjkiees.2013.24.2.214